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Thermal resistance prediction model for IC packaging optimization and design cycle reduction
Conference paper

Thermal resistance prediction model for IC packaging optimization and design cycle reduction

Guan-Wei Chen, Chung-Hsiang Hsu, 宏鍇 王, Yan-Cheng Lin, Tang-Yuan Chen and Chen-Chao Wang
IEEE 74th Electronic Components and Technology Conference
2024

Abstract

Thermal resistance prediction

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