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Toward the micromachined vibrating gyroscope using (111) silicon wafer process
Conference paper

Toward the micromachined vibrating gyroscope using (111) silicon wafer process

Jerwei Hsieh, Wen-Chih Chen and Weileun Fang
Proceedings of SPIE - The International Society for Optical Engineering, Vol.4557, pp.40-48
2001

Abstract

(111) silicon wafer BELST process Boron etching stop Corner compensation Gyroscope RIE lag
The issues regarding structure design and fabrication in improving the performance of MVGs are discussed. Although using (111) Si wafer with existing HARM process is appropriate, some limitations on design and fabrication still exist. This study proposes a novel BELST process that can improve the device performance as well as fabrication capability of the existing techniques. The salient features of the process are described, and various design concepts have been demonstrated from the fabrication results. According to the result, MVGs with desired shape and thickness can easily be obtained using the developed BELST process.

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