Twin-bit Via RRAM with Unique Diode State in Cross-bar Arrays by Advanced CMOS Cu BEOL Process

Conference paper

Yu-Cheng Lin, Yao-Hung Huang, Kai-Ching Chuang, Yu-Der Chih, Jonathan Chang, 崇榮林 and Ya-Chin King

2023 International Conference on Solid State Devices and Materials

09/2023

Abstract

Twin-bit;RRAM;CMOS

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Title: Twin-bit Via RRAM with Unique Diode State in Cross-bar Arrays by Advanced CMOS Cu BEOL Process
Creators - without role: Yu-Cheng Lin
Yao-Hung Huang
Kai-Ching Chuang
Yu-Der Chih
Jonathan Chang
崇榮林
Ya-Chin King
Publication Details: 2023 International Conference on Solid State Devices and Materials
Identifiers: 9957770220706774
Academic Unit: Institute of Electronics Engineering, College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: English
Resource Type: Conference paper