- 題名
- Twin-bit Via RRAM with Unique Diode State in Cross-bar Arrays by Advanced CMOS Cu BEOL Process
- 創作者：
- Yu-Cheng Lin (作者)Yao-Hung Huang (顧問)Kai-Ching Chuang (顧問)Yu-Der Chih (顧問)Jonathan Chang (顧問)Chrong-Jung Lin (顧問)雅琴 金 (作者)
- 學術資源類型
- 會議論文
- 出版日期
- 09/2023
- 出版資訊
- 2023 International Conference on Solid State Devices and Materials (SSDM)
- 語言
- 英語
- 期刊等級
- false
會議論文
Twin-bit Via RRAM with Unique Diode State in Cross-bar Arrays by Advanced CMOS Cu BEOL Process
2023 International Conference on Solid State Devices and Materials (SSDM)
09/2023
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