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Use of carbonized photoresist for optical mask repair
Conference paper

Use of carbonized photoresist for optical mask repair

Michael S. Hibbs, Burn J. Lin and Yuli Vladimirsky
Proceedings of SPIE - The International Society for Optical Engineering, Vol.922, pp.28-32
01/1988

Abstract

Electronic Optical and Magnetic Materials Condensed Matter Physics Computer Science Applications Applied Mathematics Electrical and Electronic Engineering
Carbonized novolac photoresist has been demonstrated as a patching material for clear defects in optical masks. The processing is simple and uses commonly available equipment. The patches, though not as tough as chrome, adhere well and survive mask cleaning. Mask materials appear to survive heating up to 1000°C, but distortion testing has only been done up to 500°C. Adhesion of the carbonized resist begins to degrade above 700°C processing temperature. © 1988 SPIE.

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