Using Decision Tree for Mining Semiconductor Data for Yield Enhancement

Conference paper

Y. C. Lai, Chen-Fu Chien, S. J. Wang, C. C. Chen, C. L. Yueh and H. A. Dai

International Symposium on Semiconductor Manufacturing 2004 International Symposium on Semiconductor Manufacturing 2004, pp.494-497

2004

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Title: Using Decision Tree for Mining Semiconductor Data for Yield Enhancement
Creators - without role: Y. C. Lai
Chen-Fu Chien - 國立清華大學工學院工業工程與工程管理學系
S. J. Wang
C. C. Chen
C. L. Yueh
H. A. Dai
Publication Details: International Symposium on Semiconductor Manufacturing 2004 International Symposium on Semiconductor Manufacturing 2004, pp.494-497
Identifiers: 9957774286306774
Academic Unit: Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper