Using Rough Set Theory to Diagnose TFT-LCD Manufacturing Defect and an Empirical Study

Conference paper

C. Hsu, K. Lin, C. Chien and Chen-Fu Chien

the Chinese Institute of Industrial Engineers National Conference (CIIE) the Chinese Institute of Industrial Engineers National Conference (CIIE)

2008

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Title: Using Rough Set Theory to Diagnose TFT-LCD Manufacturing Defect and an Empirical Study
Creators - without role: C. Hsu
K. Lin
C. Chien
Chen-Fu Chien - 國立清華大學工學院工業工程與工程管理學系
Publication Details: the Chinese Institute of Industrial Engineers National Conference (CIIE) the Chinese Institute of Industrial Engineers National Conference (CIIE)
Identifiers: 9957767436006774
Academic Unit: Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper