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WKB model of ferroelectric tunnel junctions for memory applications: voltage-dependent screening and electrostriction effects
Conference paper

WKB model of ferroelectric tunnel junctions for memory applications: voltage-dependent screening and electrostriction effects

Deepali Jagga, Sourav De and Artur Useinov
IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024
2024

Abstract

electrostriction effect ferroelectric multi-domain barrier screening tunneling electroresistance Electronic Optical and Magnetic Materials Energy Engineering and Power Technology Electrical and Electronic Engineering Instrumentation
In this article, the metal-ferroelectric-metal tunnel junctions (FTJ) are simulated to study the device's performance. An enhanced model, based on the Wentzel-Kramers-Brillouin (WKB) approach, has been proposed. Its results are successfully verified with experimental data, the model features embedded V -dependent interfacial screening, magnetic spin degree of freedom, electric hysteresis, and electrostriction effect for the multi-domain barrier.

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