Wireless Testing of RAM Chips by HOY: Methodology, Architecture, and Prototype Implementation

Conference paper

T.-Y. Chang, C.-T. Huang, J.-J. Liou, C.-W. Wu, H.-P. Ma, C.-C. Tien, C.-H. Wang and C.-U. Yang

IEEE International Test Synthesis Workshop, 2008

2008

Abstract

Wireless;RAM;HOY;Prototype

1 Record Views

Title: Wireless Testing of RAM Chips by HOY: Methodology, Architecture, and Prototype Implementation
Creators - without role: T.-Y. Chang
C.-T. Huang
J.-J. Liou
C.-W. Wu
H.-P. Ma - 國立清華大學電機資訊學院電機工程學系
C.-C. Tien
C.-H. Wang
C.-U. Yang
Publication Details: IEEE International Test Synthesis Workshop, 2008
Identifiers: 9957767858806774
Academic Unit: Department of Physical Education, Hsinchu Teachers College, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper