X-Ray Absorption Spectromicroscopic Analysis of SAM-Functionalized Surface

Conference paper

Y. J. Hsu, W. S. Hu, Y. T. Tao, D. H. Wei, Jo-Hsuan Sun, Chao-Huang Chen and S.C. Wang

Proceeding 8th International Conference X-ray Microscopy IPAP Conf. Series 7, p.246

2006

Abstract

Spectromicroscopy;PEEM;NEXAFS;Functionalized Surface,Self-Assembled Monolayer

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Title: X-Ray Absorption Spectromicroscopic Analysis of SAM-Functionalized Surface
Creators - without role: Y. J. Hsu
W. S. Hu
Y. T. Tao
D. H. Wei - 國立清華大學理學院先進光源科技碩士學位學程
Jo-Hsuan Sun
Chao-Huang Chen
S.C. Wang
Publication Details: Proceeding 8th International Conference X-ray Microscopy IPAP Conf. Series 7, p.246
Identifiers: 4900526215; 9957771520006774
Academic Unit: Science and Technology of Synchrotron Light Source Program, College of Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper