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X-ray scattering studies of interfacial microstructures in InxGa1-xAs/GaAs superlattices
Conference paper   Peer reviewed

X-ray scattering studies of interfacial microstructures in InxGa1-xAs/GaAs superlattices

Z.H. Ming, Y.L. Soo, S. Huang, Y.H. Kao, K. Stair, G. Devane and C. Choi-Feng
Materials Research Society Symposium - Proceedings, Vol.375, pp.171-176
1995

Abstract

Interfacial microstructures in 100-period In x Ga 1-x As(15angstrom)/GaAs(100angstrom) superlattices grown on GaAs (100) substrates by molecular beam epitaxy were studied by using large angle x-ray scattering techniques. Unusual satellite peaks in the lateral direction parallel to the sample surface were observed in a sample with x = 0.535 grown at 480°C, indicating an in-plane structural ordering. This result is confirmed by high resolution transmission electron microscopy observations that thickness modulation in the In x Ga 1-x As layers gives rise to long-range lateral periodic arrays of cluster-like microstructures with spacing on the order of a few hundred Angstroms. This thickness modulation is found to occur only in [110] direction, thus the material can be viewed as a somewhat disordered array of grown-in parallel quantum wires.

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