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Degradation Analyses On The Squeezed Vacuum States Generated From The PPLN Waveguide Chip
會議論文集

Degradation Analyses On The Squeezed Vacuum States Generated From The PPLN Waveguide Chip

Hsin-Hung Wu, Po-Hsun Chu, Tzu-Yu Huang, Jui-Yuan Hou, Hsien-Yi Hsieh, Te-Hwei Suen, Chien Ming Wu, Yen-Hung Chen 和 Ray-Kuang Lee
Proceedings: CLEO 2026, JTU.134
CLEO: Fundamental Science 2026 (Long Beach, California United States, USA, 02/05/2026–06/05/2026)
2026

摘要

We report the generation of squeezed light at 1550 nm, as well as the corresponding degradation analyses, from a fiber-based periodically poled lithium niobate (PPLN) waveguide chip. As an optical parametric amplifier (OPA), the highest squeezing level reaches over -3.0 dB. The performance of this on-chip squeezer is analyzed with the help of machine-learning quantum state tomography, to estimate the optical loss and phase noise, as well as the purity of the generated squeezed states at different pump powers. For quantum integrated optical circuits, our results provides a systematic characterization on the quantum light sources in continues variables.

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