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Simulations of electric field distributions by the susceptor-coupling effects for 2.45GHz microwave inside microwave chamber
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Simulations of electric field distributions by the susceptor-coupling effects for 2.45GHz microwave inside microwave chamber

F.-K. Hsueh, C.-C. Chang, K.-P. Huang, Y.-J. Lee, W.-F. Wu 和 T.-S. Chao
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 卷.2015-August, 頁碼.385-388
2015

摘要

Chemical activation Electric fields Failure analysis Integrated circuits Microwave heating Electric field distributions Energy distributions Fixed frequency microwaves Microwave annealing Microwave chambers Microwave processing Nonuniform heating Standing wave patterns Microwaves
Microwave annealing were able for the applications of dopant activation[1,2] and silicidation[3] of the nano-scaled transistors, However, during conventional fixed-frequency microwave heating, standing wave patterns are formed in the microwave processing chamber resulting in nodes and antinodes over the processing area. This non-uniform energy distribution in turn results in non-uniform heating, commonly observed in the kitchen microwave oven. Coupling effects to improve the uniformity and dopant activation efficiency by fixed-frequency microwave annealing process was investigated[4]. Through the aid of susceptors, the uniformity of Rs and dopant activation efficiency could be improved. © 2015 IEEE.

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https://www.scopus.com/inward/record.uri?eid=2-s2.0-84949759797&doi=10.1109%2fIPFA.2015.7224422&partnerID=40&md5=bb33a417d72ffdc7af7e09463a52c767檢視

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