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多光束雷射干涉微影系統開發與優化
Dissertation

多光束雷射干涉微影系統開發與優化

林德勛
Doctor of Philosophy (PHD), 國立清華大學, 動力機械工程學系
2017

Abstract

雷射干涉微影技術 多光束干涉微影 莫爾條紋缺陷 Laser interference lithography Multi-beam LIL Moiré pattern defects
The laser interference lithography (LIL) has two ways to fabricate the 2D periodic structures. The first method is multi-exposure LIL (2-beam LIL with double exposures), and the second method is multi-beam LIL (3-beam interference with single exposure). After simulation results, that research may have verified that multi-beam LIL has significantly better throughput than multi-exposure LIL. Therefore, this research design and develop a multi-beam LIL system. We integrate multiple theories, including those of optical interference, standing waves, and photoresist characteristics, to create a mathematical model for the LIL process. The mathematical model can accurately estimate the exposure time and reduce the LIL process duration through trial and error. In addition, LIL is very sensitive to the light source and the vibration. When there is a vibration source in the exposure environment, the standing wave distribution on the substrate will be affected by the vibration and move in a certain angle. As a result, Moiré fringe defects occur on the exposure result. In order to eliminate the effect of the vibration, we propose two methods for eliminating the vibrations from environment and improve the quality of the exposure process.

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