Abstract
This thesis reported that the multi-wave x-ray diffraction technology was employed in studying the dynamical effects of these diffracted beams in the crystals. These diffracted beams within the crystals produced the coherent interference. Phase information was extracted during the interference process and exhibited it on the diffraction pattern. The invariant phase of the structure factor of the multi-wave diffraction depended on the anomalous dispersion correction of the atomic scattering factor which changed with the different photon energy. Both of the amplitude and phase of the diffracted beams were very sensitive to shift with energy, when the incident x-rays were tuned to an energy close to the absorption K-edge for one of the constituent atoms of the diffraction system. Therefore, measuring the coherent interference of the diffracted beam in the crystal obtained the phase information at resonant and non-resonant conditions to understand the correlation between the phase information and the anomalous dispersion correction which were related to the properties of diffraction physics. Choosing the forbidden reflection as the primary reflection decreases the contribution of the real part of the anomalous dispersion correction and considering the tensor form properties of the structure factor near the resonant energy to receive more phase information. The high-order hkl reflections are chosen as the secondary reflection to reduce the kinematical effect in the multi-wave line-profile to estimate the phase information quantitatively.