A Deep Neural Network (DNN) Based Approach for Quality and Reliability Screening of Integrated Passive Devices (IPDs)

Thesis

Pan, Yann-Chern

Masters, 國立清華大學, 電機工程學系所

2017

Abstract

被動元件測試

可靠度

品質

積體被動元件

深度神經網路

Passive Device Test

Reliability

Quality

Integrated Passive Device

Deep Neural Network

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Title: A Deep Neural Network (DNN) Based Approach for Quality and Reliability Screening of Integrated Passive Devices (IPDs)
Translated title: A Deep Neural Network (DNN) Based Approach for Quality and Reliability Screening of Integrated Passive Devices (IPDs)
Creators: Pan, Yann-Chern
Contributors: Wu, Cheng-Wen (Advisor)
Awarding Institution: 國立清華大學, 電機工程學系所; Masters
Theses and Dissertations: Masters, 國立清華大學, 電機工程學系所
Language: English
Resource Type: Thesis
Date published: 2017