Logo image
A Fast and Reliable Read 28nm 32kb STT-MRAM macro using Continuous-Recording-and-Enhancement Voltage-Mode Sense Amplifier
Thesis

A Fast and Reliable Read 28nm 32kb STT-MRAM macro using Continuous-Recording-and-Enhancement Voltage-Mode Sense Amplifier

Yang, Tzu-Hsien.
Masters, 國立清華大學, 電機工程學系所
2017

Abstract

自旋力矩轉移-磁阻式隨機存取記憶體 感測放大器 預放大器 非揮發性記憶體 製程飄移容忍 高速讀取 STT-MRAM Sense-amplifier Pre-amplifier NVM Process-variation-tolerance High-speed-read
abstract hide

Metrics

1 Record Views

Details

Logo image