Abstract
We present a scan test methodology – called Cool Universal Multicasting Scan (CUMC-Scan) for not only compressing test data volume but also reducing scan test power. Combining the universal segmented shifting and multi-testing based partial capture, it is the first time to solve the overall scan test power violation under a test compression scheme. CUMC-Scan doesn’t need any support from specific ATPG tool and modification on the existing scan architecture. The experimental results indicate we can reduce 88.6% average power and 34.7% peak power in average for real designs.