A Reliability-aware Write Termination Scheme for Resistive Random Access Memory

Thesis

Lin, Wen Zhang

Masters, 國立清華大學, 電機工程學系

2016

Abstract

電阻式隨機存取記憶體

寫入電路

Resistive Random Access Memory

Write Scheme

因申請專利緣故，資料延後公開。

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Title: A Reliability-aware Write Termination Scheme for Resistive Random Access Memory
Translated title: A Reliability-aware Write Termination Scheme for Resistive Random Access Memory
Creators: Lin, Wen Zhang
Contributors: Chang, Meng Fan (Advisor)
Awarding Institution: 國立清華大學, 電機工程學系; Masters
Theses and Dissertations: Masters, 國立清華大學, 電機工程學系
Language: English
Resource Type: Thesis
Date published: 2016