Abstract
We develop a automatic test pattern generator (ATPG) for stuck-at faults, transition faults and path delay faults. Our ATPG is based on a SAT engine. The SAT engine has efficient implementation of justification and implication. Our stuck-at fault ATPG uses the path-oriented algorithm. The path-oriented algorithm is that when we find a propagation path which can’t propagate the fault, we change another path one by one. We will show the experimental data of our stuck-at fault ATPG compared with Atalanta ATPG and PODEM-like ATPG. Our stuck-at fault ATPG is more efficient than Atalanta ATPG and PODEM-like ATPG. We implement functional justification tests to transition faults. The propagation path of transition faults uses the path-oriented algorithm similar to stuck-at fault ATPG. Our path delay fault ATPG generates test patterns for Robust paths, Non-robust paths and Functional Sensitizable paths. We propose a SAT-based approach of implementing path delay fault ATPG. It decreases the complexity of ATPG by keeping the constraints information from the last path.