Analysis and Comparison of Power Semiconductor Test Circuits

Thesis

Han, Ning

Masters, 國立清華大學, 電機工程學系

2013

Abstract

功率元件切換特性

Power semiconductor switching characteristics

IGBT

MOSFET

因申請專利緣故，資料延後公開

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Title: Analysis and Comparison of Power Semiconductor Test Circuits
Translated title: Analysis and Comparison of Power Semiconductor Test Circuits
Creators: Han, Ning
Contributors: Cheng, Po-Tai (Advisor)
Awarding Institution: 國立清華大學, 電機工程學系; Masters
Theses and Dissertations: Masters, 國立清華大學, 電機工程學系
Language: English
Resource Type: Thesis
Date published: 2014