Abstract
The thesis investigates the focusing behavior and resonance effect in curved multiplate X-ray cavity using back-diffraction. At the photon energy of 14.4388 keV, the atomic plane (12 4 0) of Silicon was selected as back diffraction. As the beam passes through the device, the transmitted beam-focusing and back diffraction occur at the same time. The measurement on the transmitted x-ray beam size through the crystal cavities shows a reduced focal length and a long beam waist at the focal point. We also observed the resonance effect from this device. Accordingto the X-ray dynamical diffraction theory, we could obtain information of coordinates of dispersion surface, wavevector and wavefield inside and outside the crystal device. Based on the consideration of the excitation of the dispersion surface for each curved crystal surface involved in the crystal device, beam focusing and beam splitting occur, leading to the observed focusing feature. Detaileddynamical calculations on the transmitted intensities at different positions near the focal point will be discussed.