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CMOS 製程相容之阻可見光紫外光光電晶體
Thesis

CMOS 製程相容之阻可見光紫外光光電晶體

王羽廷
Masters, 國立清華大學, 光電工程研究所
2017

Abstract

紫外光光偵測器 光電晶體 阻可見光濾波器 紫外光 CMOS製程 UV Ultraviolet Photodetectors Phototransistors Lateral Bipolar Phototransistors Visible-blind Filter CMOS Process Compatible
With the rapid development of the IoT (Internet of Things) and smart devices, People pay more attention to and demand more need for high quality optical sensors. In recent years, tremendous progress has been reported with silicon based devices in visible range. For nonvisible range, such as in ultraviolet and Infrared region, wide bandgap material and III-V semiconductors are usually adopted, which is expensive and incompatible. Therefore, we can develop a silicon-based ultraviolet photodetector using a standard CMOS process. It can be easily integrated with the IC circuit and significantly reduce production costs. In this thesis, we propose a new design and fabrication method of Al-SiO2-Al (metal-dielectric-metal structure) visible-blind ultraviolet Fabry-Pérot bandpass filter, integrated with the current gain increment interdigitated lateral bipolar phototransistors. We successfully demonstrate suppression of visible light with the highest responsivity 9.78E-2 (A/W) at wavelength of 350 nm.

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