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Diagnosing Deep SubMicron Defects For Path Delay Fault
Thesis

Diagnosing Deep SubMicron Defects For Path Delay Fault

Min-Pin Kuo
Masters, 國立清華大學, 電機工程學系
2003

Abstract

延遲診斷 delay diagnosis
The goal of diagnosis method is to determine the suspected faulty node which is the most probable cause of the observed failures. An efficient diagnosis tool can drastically reduce the redesign time by providing the designers with a small set of possible faults to investigate. In this thesis, we have proposed a method of delay fault diagnosis. We apply a testing methodology [1] to have two times for every path. These two times, form a lower and upper bound respectively on the delay of path. We translate the path bound to linear programming equations [2]. We can solve the equations and use the result for diagnosing delay defect. Then, we simplify the linear programming equation in advance to improve diagnosis. The experimental result shows the accuracy of our diagnosis methodology. 1

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