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Evaluating Statistical Delay Defect Coverage for FPGA Test Configurations
Thesis

Evaluating Statistical Delay Defect Coverage for FPGA Test Configurations

Hsiang-Chieh Liao
Masters, 國立清華大學, 電機工程學系
2003

Abstract

延遲測試 評估 缺陷 場可程式化閘級陣列 delay testing evaluate defect FPGA
Testing for FPGA performance problems has become an important task for ever-increasingly advanced technology. To develop testing methodologies, an effective evaluation tool should play an important role in this process. In this thesis, we present an FPGA fault simulation tool (FFAST). This tool can report coverages of randomly distributed multiple defects causing delay faults in FPGAs. FFAST can also identify paths (test configurations) which are not covered in the current tests. This information can be used to further improve the quality of test configuration sets.

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