High-Dimensional Location-Dispersion Models with Applications to Root Cause Analysis in Wafer Fabrication Processes

Thesis

Lin, Shun-Chih

Masters, 國立清華大學, 統計學研究所

2017

Abstract

柴比雪夫貪婪演算法

高維度訊息準則

模型選擇

Chebyshev greedy algorithm

high-dimensional information criterion

model selection

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Title: High-Dimensional Location-Dispersion Models with Applications to Root Cause Analysis in Wafer Fabrication Processes
Translated title: High-Dimensional Location-Dispersion Models with Applications to Root Cause Analysis in Wafer Fabrication Processes
Creators: Lin, Shun-Chih
Contributors: Ing, Ching-Kang (Advisor)
Awarding Institution: 國立清華大學, 統計學研究所; Masters
Theses and Dissertations: Masters, 國立清華大學, 統計學研究所
Language: English
Resource Type: Thesis
Date published: 2018