Abstract
Test patterns of path delay faults (PDFs) are usually generated with static or robust sensitizing criteria for side inputs of gates, because defects affecting the delays of the PDFs will be captured by these patterns unconditionally. However, under functional sensitization (FS), there exist a class of defects that can be tested unconditionally, if they are not masked by the off-input controlling values. In the first part of this thesis, we propose a new pattern generation method for functionally sensitizable PDFs to improve the detectability of defects. We use conflict analysis to build a FS decision tree. Then traverse the tree for analyzing the quality of test patterns. It is shown in the experiments that with the proposed method, extra segments (up to 24.02% for one benchmark) of critical paths become testable compared with only robust/non-robust patterns. In order to test small delay defects, the transition fault pattern generation should test each defect with the long path. For this purpose, we apply the concept of PDFs for transition fault pattern generation in the second part of this thesis. This pattern generation searches the longest path for testing the small delay defects. We apply the FS ATPG in the first part into this transition fault pattern generation for testing each transition fault with longest FS path. In experimental results, we compare FS test patterns with robust/non-robust test patterns. It shows that FS test pattern exist the longest path for test each transition fault. In average, there are 5.34% transition faults detected with the longer path if FS is considered.