Integrating data mining and signal processing to enhance open/short defect location identification in TFT-LCD array process and empirical study

Thesis

Lee, Chieh

Masters, 國立清華大學, 工業工程與工程管理學系所

2017

Abstract

資料挖礦

斷路與短路測試

支援向量機

有限脈衝響應濾波器

面板陣列製程

Data Mining

Support Vector Machine

Finite Impulse Filter

Test for Open/Short

TFT-LCD Array Process

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Title: Integrating data mining and signal processing to enhance open/short defect location identification in TFT-LCD array process and empirical study
Translated title: Integrating data mining and signal processing to enhance open/short defect location identification in TFT-LCD array process and empirical study
Creators: Lee, Chieh
Contributors: Chien, Chen-Fu (Advisor)
Awarding Institution: 國立清華大學, 工業工程與工程管理學系所; Masters
Theses and Dissertations: Masters, 國立清華大學, 工業工程與工程管理學系所
Language: English
Resource Type: Thesis
Date published: 2018