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Localized Surface Plasmon Resonance of Gold Nanodot and Nanowire Arrays Fabricated by Atomic Force Microscopy Nanolithography
Thesis

Localized Surface Plasmon Resonance of Gold Nanodot and Nanowire Arrays Fabricated by Atomic Force Microscopy Nanolithography

Yi-Jen Wu
Masters, 國立清華大學, 材料科學工程學系
2006

Abstract

原子力顯微術奈米微影術 金奈米粒子陣列 區域表面電漿共振 Atomic Force Microscopy Nanolithography Gold nanoparticle array Localized Surface Plasmon Resonance
This work utilizes atomic force microscopy nanolithography to fabricate gold nanodot and nanowire arrays on silicon substrates, and dark-field optical microscopy to investigate their localized surface plasmon resonance characteristics. For an obtained gold nanodot array, the average diameter is around 50 nm after thermal treatment. For the gold nanowire arrays, the thickness is 15 □ 20 nm and the widths are ranging between 50 and 100 nm. The scattering spectra are composed of two resonance peaks in the blue and the red regions. It is also found that when the width is increased, the red peak experiences a red shift, whereas the blue peak remains unchanged. It is clear that the two peaks can be attributed to resonances along the thickness and width directions of the nanowires. Furthermore, 1-Dodecanethiol, 1-Octadecanethiol, and 16-Mercaptohexadecanoic acid are chosen to perform gold nanowire surface modification respectively; the result indicates the sensitivity of gold nanowires to local dielectric environment change.

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