Manufacturing Intelligence via Convolutional Neural Network for automatic defect recognition and An Empirical study in TFT-LCD array process

Thesis

Lin, Chun-Hui

Masters, 國立清華大學, 工業工程與工程管理學系碩士在職專班

2016

Abstract

薄膜電晶體液晶顯示器

自動光學檢測

自動缺陷分類

卷積神經網絡

深度學習

Automatic Defect Classification (ADC)

Automatic Optical Inspection (AOI)

Convolutional Neural Networks(CNNs)

Deep Learning (DL)

TFT-LCD

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Title: Manufacturing Intelligence via Convolutional Neural Network for automatic defect recognition and An Empirical study in TFT-LCD array process
Translated title: Manufacturing Intelligence via Convolutional Neural Network for automatic defect recognition and An Empirical study in TFT-LCD array process
Creators: Lin, Chun-Hui
Contributors: Chien, Chen-Fu (Advisor)
Awarding Institution: 國立清華大學, 工業工程與工程管理學系碩士在職專班; Masters
Theses and Dissertations: Masters, 國立清華大學, 工業工程與工程管理學系碩士在職專班
Language: English
Resource Type: Thesis
Date published: 2017