Post-silicon Test Flow for Aging Prediction

Thesis

Post-silicon Test Flow for Aging Prediction

Gao, Zih-Huan

Masters, 國立清華大學, 電機工程學系所

2016

Abstract

電路老化

可靠度

測試

邏輯閘層級

時序模擬

蒙地卡羅

負偏壓溫度不穩定性

reliability

Aging

testing

timing simulation

gate level

Monte Carlo

NBTI

Negative-bias temperature instability

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Details

Title: Post-silicon Test Flow for Aging Prediction
Translated title: Post-silicon Test Flow for Aging Prediction
Creators: Gao, Zih-Huan
Contributors: Liou, Jing-Jia (Advisor)
Awarding Institution: 國立清華大學, 電機工程學系所; Masters
Theses and Dissertations: Masters, 國立清華大學, 電機工程學系所
Language: English
Resource Type: Thesis
Date published: 2017