Abstract
本論文為國內第一篇以二次離子質譜術 ( Secondary ion massspectrometry, SIMS)為主題所撰寫成的博士論論文。二次離子質譜術自1989年由凌永健教授引進國內後，才開始應用在化學方面的研究。目前國際間有關二次離子質譜術在化學方面的應用研究已有約20年歷史，但有機物質如聚合物的離子形成理論尚未有定論，因此有關離子形成機制的研究是中非常重要的。本論文應用二次離子質譜術中的靜態質譜分析與縱深分佈分析功能分別對均質有機聚合物質、鋁╱聚二氟乙烯、聚甲基丙烯酸甲酯與聚碳酸酯摻合體、聚氧乙烯壬烷基苯基醚與聚甲基丙烯酸甲酯的混合膜、聚氧乙烯壬烷基苯基醚與聚甲基丙烯酸甲酯和聚碳酸酯的混合膜、聚氧乙烯壬烷基苯基醚在銅箔上之殘留以及聚甲基丙烯酸甲酯表面之光學鍍膜與耐隆布料表面的氟素撥水撥油劑等進行實驗研究並獲致相當多的結果資料; 並且建立質量範圍擴充至2000 amu的基本功能，以供後進研究者的參考。聚合物一般為非導體，需特別注意電荷累積與表面損傷的問題，縱深分佈分析時，則需考慮離子束混合與離析效應的現象。適當地運用靜態二次離子質譜分析，可鑑定聚合物表面的化學結構與狀態、有機物在材料表面的污染以及有機小分子與大分子的混合情形等。縱深分佈分析可觀察聚合物表面積荷與損傷，更可用來描述有機聚合物╱金屬、金屬╱有機聚合物以及有機聚合物╱有機聚合物的界面。This Ph.D dissertation is the domestically first one based onSIMS(Secondary ion mass spectrometry). SIMS was introduced intoR.O.C. by Professor Ling in 1989 and was started to be used inchemical research. Internationally, SIMS has been applied inchemical research for about 20 years. The ion formation fororganic materials, e.g. polymer, was still ambiguous. Theresearch on the mechanism of iob formation is thus important.This study adapted static SIMS and depth profiling for theexploraion of homogeneous polymers, aluminum/polyvinylidenefluoride(PVDF), polymer blend of polymethyl methacrylate(PMMA)and polycarbonate(PC), mixing film of polyoxyethylene nonylphenyl ether(NPEO) and PMMA, film fo NPEO mixed with PMMA/PCblend, NPEO residues on copper filme, optical coating on PMMAand fluorine-contained water/oil repellent on nylon cloths.Enormous reslts were obtained. The basic operation forexpanding mass range to 2000 amu is also developed in thisdissertation. Most of polymers are insulators. Accordingly,charge accumulation and surface damage must be cautioned duringSIMS analysis. As for depth profiling, ion beam mixing andsegregation should be considered. Static SIMS can be used forthe characterization of surface structure of polymers, organiccontamination on materials and surface phenomena of organicmolecules and macromolecules mixture. Depth profiling can beused for the observation of charging effect and surface damageas well as for the decipher of polymer/metal, metal/polymer andpolymer/polymer interface.