Abstract
The coherent diffractive imaging (CDI) technique offers a promising path toward characterization of the individual non-periodic and near-periodic isolated nanostructures at the atomic resolution. In this aberration-free microscopy, the complex exit surface wave function can be recovered from the over-sampled far-field diffraction pattern using iterative algorithms. We have recorded the image and diffraction pattern of the individual MgO nano-particle with a size of about 24nm with a crystallographic orientation [001] along the incident electron beam. The FEG-TEM (JEOL 2010F) was operated at 200keV accelerating voltage in the nano-area electron diffraction regime. For the reconstruction we utilized the phase-retrieval algorithm with dynamically defined support. The result is in agreement with the TEM image of the particle.