Abstract
To construct a reversible sequential circuit, reversible sequential elements are required. This work presents novel designs of reversible sequential elements such as the D latch, JK latch, and T latch. Based on these reversible latches, we construct the designs of the corresponding flip-flops. Then, we further discuss the test costs, including the test generation and test application, of reversible sequential circuits with these reversible flip-flops. Compared with previous work, the implementation cost of our new designs, including the number of gates and the number of garbage outputs is considerably reduced.