Abstract
With the advance of the IC manufacturing technology, test cost is becoming more and moreimportant. These trends including more complex design, more pin count, and higher working frequency, make IC test more and more difficult. Traditional test technologies use expensive testers to hold product yield and fault coverage, but it makes the test cost ratio of the IC cost increasing. To solve the issue of the test cost, we propose a new test method: HOY (Hypothesis, Odyssey, and Yield). The hardware and the software of the HOY system are different with traditional test. To reduce the labor effort, we implement a tool to generate the test program for the HOY tester automatically. Hence, users needn't study the documents about HOY, and they just need to operate our tool which includes a graphic user interface step by step. For production test and engineering test, we provide convenient methods to generate test program. Additionally, our tool supports two types of design-for-tests including memory BIST (Built-In Self Test) and logic BIST, and it also keeps the flexibility to expend other test requirements. The test program generated via our tool can also do parallel test, so test time can be reduced. Finally, we do an experiment to display the advantage of our tool.