Abstract
The physical property measurement of microwave materials is an important research topic to determine the accurate parameters in the design of circuit components. The purpose of this research is to present how the ferromagnetic resonance (FMR) interacts with the structure resonance and propose a new method to measure the saturation magnetization, the anisotropic field, and the conductivity of magnetic films. The T-microstrip resonator was fixed on the universal test fixture that was connected with the HP 8722D vector network analyzer, and applied an uniform magnetic field on the films in various directions. Then, the transmission coefficient S21 parameters were measured at various magnetic fields by a HP 8722D vector network analyzer. When the magnetic field was increased, the deep of the transmission coefficient S21 increased initially and then decreased; in addition, the resonance frequency shifted to the right and then shifted to the left. The variant range of the deep was about 4dB and the shift range of the frequency was from –0.04GHz to 0.04GHz. The simulated anisotropic field Ha was about -379.7 Gauss and the saturation magnetization Ms was 1255.7 Gauss. These results suggest that this method simplifies the procedure for studying the physical properties of magnetic thin films.