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以原子力顯微鏡對鋯鈦酸鉛薄膜之電性量測
Thesis

以原子力顯微鏡對鋯鈦酸鉛薄膜之電性量測

陳建宇
Masters, 國立清華大學, 物理系
1999

Abstract

原子力顯微鏡 鋯鈦酸鉛薄膜 電性量測 AFM lead zirconate titanate (PZT) thin film P-E
Abstract In this experiment,we discuss that grain sizes have different effect on C-V curve and P-E curve . The result is that the film of smaller grain size have high capacity and have smoother P-E curve than the flim of greater grain size measured at different areas . In the local P-E curve, we got different curve at different frequency.When the frequency is 500mHZ, we can see the local P-E curve . If we increase sweep time,the P-E curve will decay at 500mHZ and 5mHZ;how-ever,we can not see the same phenomenon at the frequency 50mHZ.

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