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以多元迴歸實證分析專利價值與專利因素
Thesis

以多元迴歸實證分析專利價值與專利因素

侯門
Masters, 國立清華大學, 科技法律研究所
2015

Abstract

專利 價值 發光二極體 多元迴歸 實證分析 工業技術研究院 Patent Value Light Emitting Diode Multiple Regression Empirical Study Industrial Technology Research Institute
Patent transaction is becoming frequent through whole world, hence it’s necessary to study and analyze the relation among patent value and various patent indicators to develop patent value model. The subjects of this article are patents owned by Industrial Technology Research Institute (ITRI), these patents are analyzed for statistical relation among their patent value and patent indicators. This article reviews prior references discussing on relations among patent value and patent indicators and theories of how patent indicators affect patent value, to establish analytical method of this research and choose patent indicators about to be analyzed by this research. About the analytical method, this article is conducted on regression analysis used by prior research, more specifically, on logarithmic regression analysis, essentially. At first, this article use simple regression analysis to retrieve those indicators with significant relation with patent value then apply multivariate regression analysis on those indicators. By this method, this article reveals the result of chosen indicators at simple regression level and at multivariate regression level to empirically prove theories from prior references. Additionally, this article discovers the significance of some indicator found as being insignificant in prior references. Due to natural restrain on the analytical method used in this article, this article can only establish the relation of patent value with patent indicators rather than the causality thereof. Such causality shall only be investigated in future for being references for designing patent value model with the result contributed by this article.

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