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以角解析光電子能譜研究TTC於銀薄膜在鍺(111)基底上之介面結構
Thesis

以角解析光電子能譜研究TTC於銀薄膜在鍺(111)基底上之介面結構

王欽勇
Masters, 國立清華大學, 先進光源科技學位學程
2011

Abstract

角解析光電子能譜 量子井態 ARPES QWS Ge
We have studied the interfacial structures of TTC on uniform Ag thin films grown on Ge(111) by angle-resolved photoemission spectroscopy (ARPES) through the quantum- well states (QWSs) of the silver thin films. From the experimental results, we found that both the quantum-well-state energy positions and the vacuum-level shift depend on the coverage of TTC layer. The Ag QWSs shift toward the Fermi level and the vacuum level decreases with the increasing coverage of TTC films. We used the mirror-force model coupled with Bohr-Sommerfeld quantization rule to quantitatively simulate our measured energy shift of QWSs versus Ag thickness upon adsorption of 1 ML TTC films. The phase change at the film/vacuum interface thus derived is -0.62±0.08 and the resulting dielectric constants  for 1 ML TTC film by applying modified image potential model is 1.30~1.51.

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