Abstract
The purpose of this research is to design an X-ray detector, which is applied in industrial X-ray non-destructive defects inspection. This research can roughly separates into two design stages. The first stage is “Analyze the optical system of the current X-ray detector“. The prime work in this stage is searching the current X-ray detectors on the market. Then, analyze all the optical elements inside the X-ray detectors, including the physical properties of the scintillator, the working theories of the image intensifier and optical designing theories. After, we try to design a new X-ray detector base on these analyses. The second stage is “Design a new type of X-ray detector”. According to the basic optical model of the first stage, we integrate the scintillators, image intensifiers, mirrors, lens and line-scan cameras…etc to catch the information from X-ray image of the PCB. The design of the system is then using the software to find the results of optical analysis to find the optimum design of the quality of image which satisfy the requirements of the defect inspection. At last, we combine the optical simulation results and the hardware constrains to get the advisable parameters for production.