Abstract
側磨光纖可以製成各種光學元件，這些元件的敏感度可以由減少殘留的光纖包覆層或增大側磨光纖的曲率半徑來達成，但是當殘留的光纖包覆層已經很薄時，進一步的減少它將造成製程及可靠度上的困難。於是我們很感興趣的想研究增大曲率半徑對側磨光纖敏感度的影響。我們成功的製造了大曲率半徑的側磨光纖，這些側磨光纖的品質足以實驗證明側磨光纖的敏感度以分貝為單位計算時正比於其曲率半徑的根號值。我們成功的側磨光纖，直到它的之殘留的光纖包覆層剩下十分之一微米，他們的液滴測驗衰減量可達八十分貝以上。我們在側磨光纖表面適當處理後滴上液晶，成功的製造了全光纖的光學極化器，它們的極化消逝比可達六十分貝以上。我們並且將它的消逝比與它的側磨光纖液滴測驗衰減量做一番比較，發覺相當符合。據我們所知，這是第一次有如此完整的比較。我們對實驗器材各項誤差的防止及消除，以及對實驗步驟所採取的嚴謹態度，使得我們所得的實驗數值有相當的可靠度。這也使我們能用實驗數據驗證增大側磨光纖曲率半徑的好處，並且顯示出在這方面還能有許多應用的用途及發展空間。Side-polished fibers are interesting because of their versatileapplications as optical devices. Their sensitivity can beimproved either by increasing their polishing curvatures or bydecreasing the polishing depth. Their attenuation losses (indB) were proved to be proportional to . In this thesis, wefabricated single-mode side-polished fibers on Si-wafersubstrates to achieve this purpose. Our polished samples weregood enough to verify the rule. We also successfully gainedaccess to fiber cores within 0.1 mm. Side-polished fibershaving attenuation ratios more than 80 dB in liquid-dropmeasurements were successfully fabricated. Our samples alsoshowed negligible optical losses after fine polished. We madepolarizers by using our side-polished fibers. After propersurface treatments and putting liquid crystal on it, wesuccessfully showed that the extinction ratios of thesepolarizers agreed well with their liquid-drop results. To ourknowledge, it was the first time that reproducible processingand excellent agreements between the characteristics of side-polished fibers and their associated devices were presented.The extinction ratios of our polarizers were predicated higherthan 60 dB. Details of measuring system and processing wereseriously considered. Acquisitions and manipulations of data ofthis work were computerized. Noises were averaged out to aminimum. We also set up composite retardation plates inmeasuring performances of polarizers.