Abstract
In this work, an image sensor with photovoltage-sensing pixels is designed and fabricated. A digital correlated double sampling circuit is designed to cancel fixed pattern noise. The implemented column-level ADC uses a single-slope architecture with 10-bit resolution and 65 kHz sampling rate. All devices and circuits are integrated and implemented in a single chip. A 64x36 image array was fabricated with TSMC 0.18 μm CMOS technology. The array was designed for the specification of 30 frame/s in full HD. Measurement showed that the photodiode can respond to illuminance as low as 0.5 lux. At high light intensity, photodiode voltage change in log scale and the overall dynamic range is over 90 dB. The image array can respond to wide dynamic range of incident light.