Logo image
分析邏輯電路光罩佈局建立橋接錯誤
Thesis

分析邏輯電路光罩佈局建立橋接錯誤

邱嘉亮
Masters, 國立清華大學, 電機工程學系
2003

Abstract

光罩佈局 橋接錯誤 偵錯 layout bridge fault diagnosis MFD
The stuck-at fault model is popular due to its simplicity, and because it has proven to be effective both in providing high defect coverage when used as a fault model for test generation and when diagnosing a limited range of faulty behaviors. Our method uses the circuit layout to determine the relative probabilities of individual physical faults in the fabricated circuit. The concept is that a spot defect which is an area of extra conducting material that creates an unintentional electrical short in a circuit. A defect injector is described in this thesis. It can inject defect automatically and integrate the other tools to perform realistic bridging fault modeling and diagnosis.

Metrics

1 Record Views

Details

Logo image