Abstract
Prat I X-ray fluorescence imageX-ray emission from atoms usually exhibits a homogeneous intensity distribution except for the direction along a polarization axis. Here, we report the observation of unexpected ring-like images if X-ray emission from the constituent atoms of solid samples during the excitation of monochromatic synchrotron radiation ranging from 100ev to 7kev. The rings are found to result from the emitted X-ray fluorescence forming a solid cone along the direction of observation with a minimum in the central region. The semi-angle of the cones follows the E-1/2 relation, where E is the transition energy involved. The images are proved to be irrespective of incident-beam polarization and independent of the samples being amorphous, polycrystalline, or mono-crystallinePart II Soft X-ray scatteringA six-circle soft x-ray diffractometer with κ-φgeometry has been constructed and commissioned with 1-9 Kev DCM (Double Crystal Monochromater) beam line at Synchrotron Radiation Research Center. The Fifty degree inclined κ-axis provides more degree of freedom and momentum coverage in reciprocal lattice space, as specially designed. The diffractometer is usually operated in high vacuum chamber, because soft x-ray is strongly absorbed by atmosphere. Both sphere errors and angular positional errors have been verified within the values of specification. Four experiments, including powder diffraction, θ-2θ scan, reflectivity of multi-layer thin films, and multiple diffraction, will be discussed. All experiments have been done at the vacuum of 10-6 torr. The quartz standard powder, zeolites, Ti2O5 / SiO2 /Zerdur multi-layer thin films, and Si(111) single crystal are investigated. The excellent capability of the diffractometer in characterizing both mesoscopic and microscopic materials structure analysis is shown.