Abstract
This thesis aims to construct a time-resolved X-ray diffraction system with an improved optics, including multi-cavity systems and sapphire X-ray resonators. The fundamental theorems, experimental setups, and measurements are described by following the order of multi-cavity system, sapphire X-ray resonator, and time-resolved X-ray diffraction system.The silicon multi-cavity systems consist of more than one hard X-ray Fabry-Parot resonators (FPRs). Backward diffraction (12 4 0) at 14.4388 keV is employed to reflect the incident X-ray beam in FPRs. In practice, a three-mirror FPR that combines two FPRs were realized, of which the measured effective resonance spectrum included only one isolated resonance peak in the energy range of the backward diffraction. The bandwidth of the isolated resonance peak was improved to 0.79 meV.For sapphire crystal wafers, because of low crystal symmetry and shorter extinction length of the back reflection (0 0 0 30) at 14.3147 kev, sappire FRRs are superior to that made of silicon wafers. Experimantally, the cavity resonance experiments of sapphire FPRs have been carried out. Even though the defects in sapphire wafers and curved surfaces of crystal plates lowered the resonance efficiency, distinct resonance spectra of sapphire FPRs have been observed.For the time-resolved X-ray diffraction system, the layout of the arranged instruments, the synchronization timing control processes between the synchrotron X-rays and pumping laser pulses are reported. The standard test experiments, the time-resolved X-ray diffraction of GaAs(004), were also successfully demonstrated.