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摻銅 之鍶?釕氧化物(2116)薄膜之製作與物性量測
Thesis

摻銅 之鍶?釕氧化物(2116)薄膜之製作與物性量測

薛文鳳
Masters, National Tsing Hua University
2002

Abstract

薄膜結構霍爾係數磁性XPS拉曼散射 thin filmstructureHall coefficientmagnetic propertyXPSRaman
We have successfully deposited Sr2YRu1-xCuxO6 films. Sr2YRu1-xCuxO6 films on SrTiO3 (100) have c-axis orientation perpendicular to substrate. All measurement results ”in-plane gazing incident X-ray diffraction figures, small angle grazing incident X-ray diffraction figures and Raman spectra” indicate Sr2YRu0.9CuxO6 films have good epitaxy, pure phase and good crystal structures.Magnetic measurements indicate films superconduct at 5 ~ 8 K. Non-uniform distribution of Cu is discovered in EDS, Auger electron spectra and ESCA analyses. SEM and AFM images of films show films have flat surfaces. Sr2YRu0.9CuxO6 films’ carriers are hole-like and Hall coefficients become larger at low temperature.Ion-implantation with Cu is expected to improve the superconductivity of films. The resistivity and magnetic property are strange. Further work is needed.

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