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改良非排序特徵選取過濾法於TFT-LCD Array製程檢測之應用
Thesis

改良非排序特徵選取過濾法於TFT-LCD Array製程檢測之應用

林依祈
Masters, 國立清華大學, 工業工程與工程管理學系
2007

Abstract

資料探勘 特徵選取 分類技術 薄膜電晶體液晶顯示器 data mining feature selection classification Thin-Film Transistor Liquid-Crystal Display (TFT-LCD)
Feature selection is an effective technique in dealing with dimensionality reduction. Identifying relevant feature in the dataset and discarding everything else as irrelevant and redundant can improve the performance of classifier. Algorithm for feature selection fall into three broad techniques: wrappers use the learning algorithm itself to evaluate the usefulness of feature, embedded is built into the classifier construction, while filters assess the relevance of features by looking only at the intrinsic properties of the data. For application to large databases, filters technique have proven to be more practical than others because they are much faster. However, their performance is worse than others when the classifiers are combined. In this study we present a general framework for creating several feature subsets and then combine them into a single subset. A new combiner is proposed for selecting features to improve the performance of filter techniques that exist. Experiment results demonstracted that the new combiner approach gives the significicant improvement for k- nearest neighbor classifier, especially using on quantitative data. Finally, the proposed method was employed to analyze the TFT-LCD array process inspection. Implementation results showed that the test items have been significantly reduced and the performance has been improved.

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