Abstract
This thesis aims to propose theoretical calculations and experimental simulation for the time-resolved X-ray diffraction which is using the pump & probe experimental method in the system of epitaxial thin film of two different materials. The system is an InN epitaxial single-crystal thin film grown on sapphire substrate.We use the theory which is proposed by C. Thomsen[5], and then put forward the theoretical calculations of the laser induced strain propagating in a layered system.We also use the system of X-ray diffraction in multi-layer thin films to simulate the X-ray reflectance in the time-resolved X-ray diffraction experiment.Under different times and X-ray incidence angle, we successfully simulate the measurement results of the time-resolved X-ray diffraction experiment.