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晶圓廠生產管制手法整合與探討
Thesis

晶圓廠生產管制手法整合與探討

林明田
Masters, 國立清華大學, 工業工程與工程管理學系碩士在職專班
2004

Abstract

半導體生產管制 半導體生產指標 晶圓代工 目標層級架構 敏感度分析 Production Control Production Index Semiconductor Manufacturing Objective Hierarchy Sensitivity Analysis
The production flow of semiconductor manufacturing is the most complicated and inextricable one in the manufacturing industry. The production duration is 40-60 days, and the reentrant production flow is quite different from traditional manufacturing industry. Thus the adequate control over lead time and production cycle is the key challenge for the production management. Competition in IC manufacturing industry is getting more intense, the only way to survive is to be outstanding on Yield, Cycle Time and On Time Delivery. After thorough review on cross-factories, cross-companies comparison of production control methodologies, and also goes through literatures, such as WIP management, bottleneck management, cycle time reduction, and so on. This research aims to clarify strength and weakness of every production control methods, to point out the mystification of production indices regularly seen in this industry and to provide some solutions to common questions always happened in Fab. In the end, the management structure of total production control will be brought up, in order to provide reference to production control in Fab.

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