Abstract
The purpose of this study is to set up a X-ray image reconstruction algorism to inspect the defect in a Printed Circuit Board（PCB）. Nowadays X-ray Nondestructive Testing（NDT）has played an important role in defect inspection but the X-ray image contains all the information the rays passed by, therefore, it is hard to inspect the inner defect of PCB correctly. The correct inspect is rely on an image reconstruction system. This study uses the Algebraic Reconstruction Technique（ART）to reconstruct the vertical section image from the Planar Computer Tomography（PCT）system of PCB of several different project angles. The X-ray is assumed to be parallel beam. The limited angle of projection in PCT reduces the image reconstruction quality. To improve the quality of reconstructed image, a method combines the binary steering mechanism with ART to get the correct convergence and avoiding the local optimum solution of ART. Furthermore, the computational algorism to increase the reconstructed speed and discussing the influence between the image and the position error in machine are discussed.